Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...

During the manufacture of semiconductor wafers, thickness measurement forms an important part of this process, since it provides process engineers with the information required to ensure that ...

Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...

Palo Alto, Calif.—On the heels of the announcement by Keithley Instruments of its third-generation wafer tester, test-and-measurement giant Agilent Technologies is introducing a Windows-based ...

Keithley Instruments has announced a new CV (capacitance/voltage)-measurement-instrument module for its model 4200-SCS (semiconductor-characterization system). The ...

Capacitive sensors are found in a wide range of equipment, from consumer electronics to industrial/process control. Touch buttons are increasingly found in lamps and dimmers. Motion detectors can ...

Depending upon the distance between the surface of a capacitance probe and a target source, the electrical capacitance that is formed between these two objects will vary. In an effort to improve ...

The electron transport properties of graphene devices are critical to many applications, but our understanding of these properties is still incomplete, in spite of rapid advances in recent years. One ...

As the Semiconductor industry is growing so does the density of devices on chip. With the increasing density and decreasing spacing rules, the most significant effect that takes birth is parasitic.