Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...
Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...
Any characterisation lab engineer responsible for developing new materials, devices, or processes knows that, just like dc current-voltage (I-V) and capacitance-voltage (C-V) measurements, performing ...
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