Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was published by researchers at Infineon Technologies, University of Padova and ...
May 22, 2014. KLA-Tencor has announced the Teron SL650, a new reticle quality-control solution for IC fabs that supports 20-nm design nodes and beyond. With 193-nm illumination and multiple STARlight ...
AUSTIN, Texas — With the cost of advanced semiconductor photomask sets approaching $1 million apiece, there is a huge need for advanced software that will snare mask defects early in the production ...
TAIPEI, Taiwan — At the Semicon Taiwan trade show here today, KLA-Tencor Inc. rolled out its latest defect management hardware and software tools for use in identifying and eliminating ...
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