SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

Process management tools company Electroglas Inc. today introduced DefectID, its automatic defect classification software. Aimed at improving manufacturing productivity and yields for wafer ...

New research paper titled “Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning” by researchers at National Tsing Hua University. “With the rapid development of artificial ...

Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

Machine learning is becoming increasingly valuable in semiconductor manufacturing, where it is being used to improve yield and throughput. This is especially important in process control, where data ...

Microtronic, maker of advanced macro defect inspection systems and software, has announced a convenient and highly precise way to monitor the weights of semiconductor wafers at the same time as ...

According to news reports, Samsung and TSMC are expected to enter 5nm process mass production in 2020. The competition in 5nm wafer yield and market share will be very intense. A brand new wafer ...

MILPITAS, Calif., July 8, 2019 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the 392x and 295x optical defect inspection systems and the eDR7380™ e-beam defect review system. The new ...

To make the top-of-the-line chips for Apple's iPhone, such as the A14, or Nvidia's A100 series AI processors, with billions of transistors, it takes a factory that costs $16 billion to build and ...