Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
TOKYO, Dec. 03, 2022 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (ATE) (TSE: 6857) today unveiled the E5620 Defect Review Scanning Electron Microscope ...
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