Schematic illustration of Friction Force Microscopy (FFM). The AFM cantilever, a small diving board-like structure about 200 micrometers long, 50 micrometers wide, and 1 micrometer thick, has a sharp ...

Escherichia coli bacteria imaged by high-speed inline force mapping and fluorescence microscopy. Simultaneous topography and elastic modulus maps show a stiffening of the division site. Light and ...

Kelvin probe force microscopy (KPFM) belongs to a suite of electrical characterization methods made available in scanning probe microscopes. It maps the contact potential difference (CPD) between a ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

NC-AFM 2026 is the 27 th of a series of conferences devoted to non-contact atomic force microscopy. The conference covers ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...

PFM is based on the converse piezoelectric effect, where an applied electric field induces mechanical strain in piezoelectric materials. In PFM, an AC voltage is applied between a conductive atomic ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Current optical and electron microscopy imaging techniques are not suited for measuring the dynamic characteristics of living microorganisms at tiny scales due to complex sample preparation methods or ...