What is Electron Backscatter Diffraction (EBSD)? Electron backscatter diffraction (EBSD), also known as backscatter Kikuchi diffraction (BKD), is a powerful characterization technique used to analyze ...

In geology, electron backscatter diffraction (EBSD) is a powerful tool for the observation and analysis of microstructures and for phase identification. The EBSD system, by Oxford Instruments, ...

A scanning electron microscope, acquired in 2016 with a grant from the National Science Foundation, provides a powerful tool for students, faculty, and visiting researchers to study the structure and ...

This article has been updated in January 2024. High resolution images of microscopic samples can be obtained experimentally using Scanning Electron Transmission Microscopy (STEM). It is an effective ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

Electron backscatter diffraction (EBSD) maps of the investigated Inconel 718 alloys. Inverse pole figure (IPF) maps along the X direction (horizontal) are presented for a A wrought and fully ...

Electron diffraction is a powerful analytical technique used to study the atomic structure of materials. It involves the interaction of a beam of electrons with a crystalline sample, resulting in a ...

With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...

FFT-EM is an innovative method that represents a combination of FFT and EM techniques such as scanning electron microscopy (SEM). The technique is often used to determine the interior and surface ...

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...