It has been over 30 years since the first focused ion beam was used to make a TEM specimen. FEI, a company that is now part of Thermo Fisher Scientific, has been an essential part of helping take ion ...
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
China is restricting exports of two niche metals — germanium and gallium — that are key to manufacture electronics and semiconductors, as the tech battle with the U.S. and Europe heats up. Germanium ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results