Nanomanipulation under scanning electron microscopy (SEM) enables direct interactions of a tool with a sample. We recently developed a nanomanipulation technique for the extraction and identification ...

All SEMs are supplied with a loading chamber or a sample holder where the sample is inserted. The use of aluminum stubs is recommended to load a sample in an SEM. These come in various standard sizes ...

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.

SEMs are capable of imaging many different sample types including semiconductors, metals and alloys, polymers, ceramics and biological samples. Some samples can be more difficult to image and must be ...

A variety of scanning electron microscopy techniques are available to medical manufacturers to assist in analyzing and characterizing material surfaces. by John Humenansky Table I. A breakdown of the ...