Gilbert Laurenti, Texas Instruments Inc. Abstract Debug for SoC adds new requirements and challenges in terms of adding visibility and control to a system, simplifying integration of hardware and ...
Optimizing COT for SOCs requires a new way of thinking. Cost of test (COT) is of paramount importance to semiconductor manufacturers. COT financial models are widely used for determining the COT for ...
Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
As semiconductor devices continue to advance, the demand for reliable, high-performance test sockets has never been greater. Yet, traditional socket design validation methods—such as per-pin ...
Smiths Interconnect has created an IC test socket for high-speed testing of 350μm minimum pitch devices. Smiths Interconnect has created an IC test socket for high-speed testing of 350μm minimum pitch ...
Deep submicron technology enabled the design of the industry's first very large chips. The magnitude of the design effort involved in creating these chips led to the adoption of reuse methodologies ...
Advantest launches the DC Scale XHC32 power supply for the V93000 EXA Scale SoC test platform. It offers 32 channels with an unprecedented single-instrument total current of up to 640A, enabling the ...
Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...
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