An explosion in design complexity, fueled by increased transistor density and fundamental shifts in chip architectures, are beginning to overwhelm traditional approaches to test. Defects can show up ...
Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...
Scan diagnosis is an established method for identifying and locating semiconductor defects on devices that fail manufacturing test and on field returns. Effectively selecting the right devices for ...
SAN JOSE, Calif. -- Dec. 19, 2006-- LogicVision, Inc. (Nasdaq: LGVN), a leading provider of semiconductor test and yield learning solutions, today announced that Tundra Semiconductor Corporation (TSX: ...
About a dozen years ago, the world of test had reached an economic impasse: most digital designs had become sufficiently complex that standard scan testing techniques were no longer cost-effective.
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